Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity

Direct detection electron energy-loss spectroscopy: a method to push the limits of resolution and sensitivity, JL Hart, AC Lang, AC Leff, P Longo, C Trevor, RD Twesten, ML Taheri, Scientific reports 7 (1), 8243

People

Jamie Hart
Andrew Lang
Asher Leff
Mitra Taheri

Research

Electron Microscopy Development: In Situ, Operando, and Intelligent, Autonomous Microscopy

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